Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].
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There are no discussion topics on this book yet. Test Generation for Sequential Circuits — Ch. Dilip Kumar rated it really liked it Jan 31, Testable Combinational Logic Circuit Design. Built-In Self Test — Ch. Com clrcuit it did not like it Nov 05, Preview testabilty item Preview this item. There’s no description for this book yet. User Review – Flag as inappropriate very useful book for testing of vlsi. Digital integrated circuits — Testing.
Please enter recipient e-mail address es. Tap rated it really liked it Sep 19, Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied.
Digital Circuit Testing and Testability by Parag K. Lala
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Digital Circuit Testing and Testability
The E-mail Address es field is required. This text reviews many hesting techniques and methodologies to show how to design systems that are fault tolerant. The name field is required.
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This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. Parag K Lala Find more information about: Faults in Digital Circuits — Ch. Jun 01, Ajitha rated it it was amazing. Your request to send this item has been completed.
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