Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].

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There are no discussion topics on this book yet. Test Generation for Sequential Circuits — Ch. Dilip Kumar rated it really liked it Jan 31, Testable Combinational Logic Circuit Design. Built-In Self Test — Ch. Com clrcuit it did not like it Nov 05, Preview testabilty item Preview this item. There’s no description for this book yet. User Review – Flag as inappropriate very useful book for testing of vlsi. Digital integrated circuits — Testing.

Please enter recipient e-mail address es. Tap rated it really liked it Sep 19, Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied.


Digital Circuit Testing and Testability by Parag K. Lala

Prefer the physical book? In the past few years, reliable hardware system design has become increasingly important in the computer industry.

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Digital Circuit Testing and Testability

The E-mail Address es field is required. This text reviews many hesting techniques and methodologies to show how to design systems that are fault tolerant. The name field is required.

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This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. Parag K Lala Find more information about: Faults in Digital Circuits — Ch. Jun 01, Ajitha rated it it was amazing. Your request to send this item has been completed.

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